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The Epsilon 4, an energy dispersive X-ray fluorescence (EDXRF) benchtop spectrometer, offers non-destructive elemental analyses of impurities in active pharmaceutical ingredients and excipients in ...
Scanning Electron Microscope JEOL 5900 with SDD EDS detector and CT unit, upgraded with SAMx hardware and XMAs/IDFix/Diss5 analytical software XRF Panalytical Axios mAX 4 kW, X-ray fluorescence ...