Scanning tunneling microscope - Wikipedia
A scanning tunneling microscope (STM) is a type of scanning probe microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986.
扫描隧道显微镜 - 维基百科，自由的百科全书
扫描隧道显微鏡 （英語： Scanning Tunneling Microscope，缩写为 STM），是一种利用 量子隧穿效应 探测物质表面结构的仪器。 它于1981年由 格尔德·宾宁 及 海因里希·罗雷尔 在 IBM 位于 瑞士 苏黎世 的苏黎世实验室发明，两位发明者因此与电子显微鏡的发明者 恩斯特·鲁斯卡 分享了1986年 诺贝尔物理学奖。 扫描隧道显微鏡技术是 扫描探针显微术 的一种，基于对探针和表面之间的隧穿电流大小的探测，可以观察表面上单 原子 级别的起伏。 此外，扫描隧道显微鏡在低温下可以 …
Scanning tunneling microscope (STM) | Britannica
Scanning tunneling microscope (STM), type of microscope whose principle of operation is based on the quantum mechanical phenomenon known as tunneling, in which the wavelike properties of electrons permit them to “tunnel” beyond the surface of a solid into regions of space that are forbidden to them
Scanning Tunneling Microscopy (STM) - Chemistry LibreTexts
2023年8月29日 · The principle of STM is based on tunneling of electrons between this conductive sharp probe and sample. What is Tunneling? Tunneling is a phenomenon that describes how electrons flow (or tunnel) across two objects of differing electric potentials when they are brought into close proximity to each other.
Scanning Tunneling Microscopy - Harvard University
The scanning tunneling microscope was invented in 1982 by Binnig and Rohrer, for which they shared the 1986 Nobel Prize in Physics. The instrument consists of a sharp conducting tip which is scanned across a flat conducting sample.
40 years of scanning tunnelling microscopy - Nature
2022年4月28日 · 40 years ago, the first atomic-resolution images using scanning tunnelling microscopy were seen.
Scanning Tunneling Microscope Introduction | NIST
2015年4月29日 · The scanning tunneling microscope (STM) is widely used in both industrial and fundamental research to obtain atomic-scale images of metal surfaces. It provides a three-dimensional profile of the surface which is very useful for characterizing surface roughness, observing surface defects, and determining the size and conformation of molecules ...
Scanning tunneling microscope - IBM
The scanning tunneling microscope (STM), introduced in 1981 by IBM physicists Gerd Binnig and Heinrich Rohrer, is widely credited with shining a light on atomic-level mysteries, giving rise to the field of nanotechnology, and forever altering the trajectory of modern electronics.
Scanning Tunneling Microscope - NIST
2009年7月13日 · The scanning tunneling microscope (STM) is widely used in both industrial and fundamental research to obtain atomic-scale images of metal surfaces. It provides a three-dimensional profile of the surface which is very useful for characterizing surface roughness, observing surface defects, and determining the size and conformation of molecules ...
We present here the historic development of Scanning Tunneling Microscopy; the physical and technical aspects have already been covered in a few recent reviews and two conference proceedings [l] and many others are expected to follow in the near future. A technical summary is given by the sequence of figures which stands alone.